Utilization of low voltage electron diffraction at high speed to solve practical materials problems
This webinar shows examples of low-voltage, high-speed electron diffraction experiments using the Gatan Stela, a detector with a high-dynamic range, based on DECTRIS' fast hybrid-pixel technology, to study subtle structural changes.
High-resolution with the CryoARM/K3 combo: SerialEM, Latitude, and future data collection
Recent results have demonstrated the ability of the CryoARM/K3 combination to produce structures at ultra-high resolution for particles of various sizes and symmetries. Following the initial technical achievements, this hardware combination is now being used to provide important biological insights as well. In this presentation, Alan Merk, Electron Microscopist from NIH, will review some of the structures we have obtained in the past with the CryoARM/K3 using SerialEM, report on ongoing work with Latitude S, and look forward to future directions.
Improving sample analysis using combined energy-dispersive and cathodoluminescence spectroscopies
In this webinar, Timmons Erickson, Ph.D., Research Scientist, Jacobs Technology Inc., reviewed how the simultaneous capture of EDS and CL spectroscopic data proved invaluable in analyzing a chondritic meteorite collected in Antarctica.
In-situ data processing with GMS 3.4: Drift correction - ROI
In this video we demonstrate additional techniques for drift correction using an ROI (region of interest) within the full field of view of an acquired in-situ dataset.
In-situ data processing with GMS 3.4: Drift correction - Full frame
In this video we demonstrate techniques for drift correction using the full field of view of an acquired in-situ dataset.
Characterization of nanophotonic devices far below the diffraction limit workshop
This workshop demonstrates how the Monarc® Pro CL detector can deliver the most comprehensive understanding of nanophotonic devices with a live demonstration showing the characterization of plasmonic and photonic crystal samples.
Electron Energy-Loss Spectroscopy for Semiconductor Device Characterization
At EAG Laboratories, we analyze many different types of nanoengineered materials for researchers from the industry, national labs, and governmental agencies. For silicon devices, virtually all the critical materials problems are at the interfaces. STEM-EELS hyperspectral mapping is a powerful technique for studying materials' structure and chemistry down to atomic resolution. The industry widely employs it for materials characterization and failure analysis.
Live Virtual Workshop: Stela Hybrid Pixel Electron Detector for 4D STEM Diffraction
This comprehensive workshop features a presentation, a live microscope demonstration (including 4D STEM data acquisition and processing), and an open Q&A session.
Using Structural Biology to Drive Pandemic Preparedness Webinar
Safe, effective, and scalable vaccines and therapeutics are needed to halt the ongoing SARS-CoV-2 pandemic. The receptor-binding domain (RBD) is immunodominant and the target of 90% of the neutralizing activity present in SARS-CoV-2 convlescent sera. To further understand this point, we structurally defined an RBD antigenic map using cryo-electron microscopy, ELISA, and BLI.
Instrumentation improvements for rapid in-situ EELS webinar
Spectroscopic mapping by STEM-EELS is a powerful technique for determining the structure and chemistry of a wide range of biological, natural, and engineered materials and interfaces down to atomic resolution. The continual push for more robust, sensitive, and localized characterization is enabled by significant and ongoing improvements to hardware throughout the STEM-EELS instrument.