Webinar

DigitalMicrograph®, or Gatan Microscopy Suite® (GMS), has become an industry-standard software tool in electron microscopy due to its ability to perform advanced: hardware control, data visualization, and data processing, both on and off-line. Scripting capability has always been included in the software, giving a high degree of customizability for users wanting to perform novel acquisition or processing methods. Python integration has now been built into GMS 3, enabling Python code to be run directly from the existing scripting interface.

Built on the existing model-based EELS quantification framework, ELNES phase mapping allows pre-acquired reference spectra (or standards) to be used for quantification in addition to the existing set of calculated cross-section models.

This webinar focuses on the importance of CL data analysis, which may include spatial, spectral, and angular information, or any combination thereof. The importance of data analysis of such CL data can be nearly as important as data acquisition and can reveal many interesting characteristics of a specimen including the influence of constituent concentration and distribution, defect density, plasmonic or photonic modes, and more. During this webinar, analysis of data drawn from various specimens is performed, their results discussed, and the benefits of such analysis demonstrated.

In this webinar, we covered many examples of usage of direct detection cameras at Northwestern University, from the imaging of soft materials to special applications of 4D STEM in hybrid interfaces. In particular, we covered the performance of the new Gatan K3 IS, which allows the acquisition of in-situ imaging and 4D STEM data in counted mode with high temporal resolution.

PRESENTER: Roberto dos Reis, Ph.D.
Department of Materials Science and Engineering, Northwestern University

In this webinar, we will review the different hardware and analysis modes available in CL detectors, discussing the benefits and drawbacks of each when analyzing geoscience specimens.

In this webinar, the second in our series on Cathodoluminescence, we discuss how simultaneous measurement of wavelength and direction can be used to reveal the light extraction and color rendering of a display device (in this case micro-LED array) as a function of viewing angle.

In this webinar Josh Kacher, from Georgia Tech, discussed the work his group is doing in applying advanced multiscale and multimodal electron-microscopy based characterization techniques to understand mechanical deformation and failure processes. He focused his results on two materials applications: understanding the influence of second phase particles in ductile failure of Al alloys and determining the role of processing conditions in strain localization during cyclic loading of additive manufactured alloys.

This webinar illustrates the application of core-loss and low-loss EELS for in situ materials characterization. Observations of in situ reductions, vacancy ordering, and gas-solid interactions can all be characterized with in situ STEM EELS. Aloof beam EELS approaches can be useful for probing near surface regions especially for systems susceptible to electron beam damage.

This webinar serves as an introduction to the CL technique and key application challenges addressed by CL highlighting some of the latest research from the world of nanophotonics, micro-LED device development and microanalysis.