Webinar

The complementary nature of electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy (EDS) signals makes it highly desirable to acquire both during transmission electron microscope (TEM) investigations of materials. With ongoing improvements in electron instrumentation and detectors, it is now practical to acquire joint EELS/EDS spectrum image data for materials analysis, all the way from large area mapping down to atomic scale analysis.

STEM EELS spectrum imaging can reveal composition and chemical changes at the nanoscale and even the atomic scale in many cases. To reveal this information, the researcher needs to optimize not only the spectrometer, but also the sample and the STEM configuration. In this webinar, we discuss how to optimize the configuration of the STEM and EELS system for high speed spectrum imaging analysis. Attendees will learn the requirements of EELS camera and spectrometer settings needed to push the limits of spectrum image performance.