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Quickly preview different sample areasQuickly preview different sample areas
Single-particle screening made simpleSingle-particle screening made simple
Study grain orientations with virtual aperturesStudy grain orientations with virtual apertures
2D diffraction pattern for each real space STEM pixel2D diffraction pattern for each real space STEM pixel
4D STEM operating principle4D STEM operating principle
Acquisition of MoSx based sample using In-Situ ExplorerAcquisition of MoSx based sample using In-Situ Explorer
OnPoint detector minimizes charging and beam damage OnPoint detector minimizes charging and beam damage
OnPoint increases 3View imaging speed four-fold OnPoint increases 3View imaging speed four-fold
Synaptic vesicles Preserves synaptic vesicle under low kV conditions
Environmental TEM: Fast is beautifulEnvironmental TEM: Fast is beautiful
Practical approaches for in-situ and environmental transmission electron microscopyPractical approaches for in-situ and environmental transmission electron microscopy
NanoCL reveals the optical properties of III-nitride LEDsNanocathodoluminescence reveals the optical properties of III-nitride light emitting diodes
XS sample mountingXS sample mounting
Dynamic tomography of InAs V-shaped membranes while in-situ heatingDynamic tomography of InAs V-shaped membranes while in-situ heating
Drift correction conpensates for Ge nanowire sample motion Drift correction conpensates for Ge nanowire sample motion
Cleaning the guns and cold cathode gaugeCleaning the guns and cold cathode gauge
Chemical and compositional analysis of 3D NAND and FinFET devicesChemical and compositional analysis of 3D NAND and FinFET devices
Electron energy loss spectroscopy (EELS) tutorial for STEM alignment.STEM alignment for EELS analysis

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