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Electron Energy-Loss Spectroscopy for Semiconductor Device Characterization
Live Virtual Workshop: Stela Hybrid Pixel Electron Detector for 4D STEM DiffractionLive Virtual Workshop: Stela Hybrid Pixel Electron Detector for 4D STEM Diffraction
Using Structural Biology to Drive Pandemic Preparedness WebinarUsing Structural Biology to Drive Pandemic Preparedness Webinar
Spectrum Imaging Picker and Slice ToolSpectrum Imaging Picker and Slice Tool
Instrumentation improvements for rapid in-situ EELS webinarInstrumentation improvements for rapid in-situ EELS Webinar
Extract line profile from spectrum imageExtract line profile from spectrum image
Reciprocal space reconstructed from continuous diffraction tomography dataReciprocal space reconstructed from continuous diffraction tomography data
4D STEM diffraction data cube 4D STEM diffraction data cube
Broad Argon Ion Beam Tool for EBSD Preparation WebinarBroad Argon Ion Beam Tool for EBSD Preparation Webinar
In-situ data processing with GMS 3.4: In-situ data management, Part 2 – Temporal reductionIn-situ data processing with GMS 3.4: In-situ data management, Part 2 – Temporal reduction
In-situ data processing with GMS 3.4: In-situ data management, Part 1 – Spatial reduction
In-situ data processing with GMS 3.4: In-situ video playback
In-situ data processing with GMS 3.4: In-situ data introduction
In-situ data processing with GMS 3.4: Live processing with in-situ datasetsIn-situ data processing with GMS 3.4: Live processing with in-situ datasets
In-situ data processing with GMS 3.4: Exporting videos from in-situ datasetsIn-situ data processing with GMS 3.4: Exporting videos from in-situ datasets
In-situ data processing with GMS 3.4: Saving in-situ datasetsIn-situ data processing with GMS 3.4: Saving in-situ datasets
Alignment procedure with the PECS II
Coating with PECS II

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